Current Events:

User Access

CENEM enables the access to high-end instrumentation in the fields of Electron Microscopy, Cryo-TEM, Scattering Methods and Scanning Probes for internal and external users.

The regulations, contact persons and booking systems for the individual methods can be found in the respective submenus Electron Microscopy, Cryo-TEM, Scattering Methods Scanning Probes Atom Probe and X-ray Microscopy .